NanoScope V controller delivers reliable, high-speed data capture of high-pixel-density images (5120 x 5120). Enables up to eight images to be simultaneously displayed/captured. HarmoniX™ nanoscale material property mapping: Veeco Presents full-spectrum harmonic image processing with high resolution, real-time quantitative results. Fluid Imaging Cells provide contact mode and TappingMode AFM imaging in fluid environments. New liquid resistant MultiMode scanners are available. A single controller now controls sample temperatures from ambient to 250°C.
The TS-75 Nanomechanical Test System is a fully integrated AFM attachment with a new performech™ DSP embedded controller, which boasts a sub 30nN force noise floor and 160X faster feedback control than the previous generation controller. Utilizing the same indenter probe to obtain insitu SPM images as to perform the nanoindentation experiment guarantees quantitative and repeatable data. Upgrade options we have: nanoDMA™ – investigate time-dependent properties of materials using a dynamic testing technique designed for polymers and biomaterials; Modulus mapping – quantitatively map the storage and loss stiffness and moduli over an area from a single SPM scan; Feedback control – operate in closed loop load or displacement control to allow testing techniques such as creep and stress relaxation; Scratch testing – quantify scratch resistance, critical delamination forces, friction coefficients and more with simultaneous normal and lateral force and displacement monitoring; Automated TriboScope® – Automated indentation on an SPM using predetermined patterns or ClickMode® allows faster data collection with less operator time.